Optical Leak Test is a versatile technology with a wide range of applications. Because of its ability to simultaneously inspect from gross to ultra-fine leaks in one test cycle and its exceptional reliability, the method is commonly used for high reliability leak testing applications like space, communications, medical, and wafer level applications.

OLT Military Standard listings:

Medical Devices
Satellite Components
Aircraft Components
Communication Equipment
Automotive Devices
Atlas 5

From satellite and space components, to photonics and microwave devices, OLT technology can be used for reliable testing of both gross and ultra-fine leaks. The system can inspect metal, ceramic, and glass lidded devices. Because the technology is not susceptible to gas absorption like other leak test methods, photonic devices can be inspected with the fibers attached.


Optical leak testing is ideal for inspecting many implantable devices such as pacemakers, defibrillators, sensors and implantable ocular devices. OLT does not use radioactive gas like Krypton 85 testing. OLT technology also eliminates the subjectivity of bubble leak testing commonly used by the industry for testing for gross leaks. Because of these advantages and others, optical leak testing has been used for production testing of implantable medical devices for over twenty years.

MEMS and Wafer Level Devices

Wafer level components with an internal cavity such as MEMS devices can be inspected with optical leak testing for both gross and fine leaks simultaneously. The full wafer can be inspected on or off a saw frame in both the non-singulated and partially singulated states.  The NorCom system reports any individual leaking components on the wafer, and the results can be networked for SPC or other tracking purposes.